The Phenom Scanning Electron Microscopes (SEMs) are compact, fast, and easy to use providing advanced analysis and imaging at the same time.
Compare the Phenom Desktop SEMs on light & electron optical magnification, resolution, digital zoom, sample size & height — and much more.
Download the comparison sheet and discover:
- The short sample loading time (30 seconds)
- No special operator training needed thanks to the intuitive interface
- Easy analysis of elemental composition with built-in X-ray detector