Gain immediate access to the Phenom ProX specification sheet
Download the specification sheet and discover the high-performance desktop SEM
The Phenom ProX SEM Generation 5 is a high-performance SEM for imaging and analysis. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Besides point analysis, the Elemental Mapping and Line Scan software allows further analysis of the distribution of elements.
Download the Phenom ProX specification sheet and learn how to:
Perform enhanced imaging thanks to new electronics and improved lens
Analyze image materials that are very sensitive to beam damage
Acquire excellent SEM images even in low vacuum conditions when analyzing non-conductive samples
Employ a high-end Secondary Electron Detector for applications that require surface-sensitive information