The Phenom ProX SEM Generation 5 is a high-performance SEM for imaging and analysis. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Besides point analysis, the optional Elemental Mapping and Line Scan software allows further analysis of the distribution of elements.
Download the Phenom ProX specification sheet and learn more about:
- Perform enhanced imaging thanks to new electronics and an improved lens
- Image materials that are very sensitive to beam damage
- Acquire excellent SEM images even in low vacuum conditions when analyzing non-conductive samples
- Employ a high-end Secondary Electron Detector for applications that require surface-sensitive information.