Download the free application note: CLEM and iCLEM explained

Correlative light and electron microscopy fuse the strengths of two different microscope platforms to provide a unique view into samples such as cellular morphology.

Although the combined imaging technique offers many possibilities, it can be difficult to overlay structures, and the results are not always satisfactory. This application note explains why iCLEM provides the ideal solution.

Download this application note to find out:

  • The challenges involved in two-step imaging
  • How integrated CLEM (iCLEM) eliminates image overlaying for accurate results in seconds
  • The advantages of using an all-in-one solution in research

Request the free application note by filling in the form ⇒